Preventing Bearing Failure

When a bearing fails in a mechanical system, spall debris is generated. The debris is collected on a magnetic chip detector (MCD), which normally is then visually inspected for excessive debris build-up.

At UDRI we have developed a new system that utilizes a stand-alone, commercially available X-ray fluorescence (XRF) spectrometer that is modified specifically to determine the morphology and identify the alloy of wear debris captured on in-line magnetic chip detectors. Use of this technique permits an accurate and consistent analysis of the metallic debris collected. Together with appropriate maintenance response to the results, this technique would almost prevent catastrophic bearing failures in machinery.

Comparison of magnetic chip detection in the past and the present.

Sample holder for patches containing particles from a chip detector:  A) patch sample stand showing 1 cm opening and B) actual surface sample holder for 16 patches.  Oil samples containing particles are analyzed in the same way.

The Lubricant Evaluation and Performance group conducts research on improved off-line and in-line diagnostic sensors for solving wear and oil contamination problems.