Materials Physics Lab Page 1

Characterization

Traditional microscopic and spectroscopic characterization methods are available in the MPL as well as a variety of specialized surface and powder analytical methods. These include:

 Microscopes

• JEOL 1200EX ASID scanning transmission electron microscope (STEM):
  • Conventional / scanning TEM / secondary electron (SEM) modes
  • EDAX UTW energy dispersive X-ray (EDS) with Emispec control system
• Digital Instruments Nanoscope II atomic force microscope (AFM)
• McAllister Ultrahigh Vacuum scanning tunneling microscope (Vac STM)
• Binocular inspection, optical petrographic, and invert metallographic microscopes

 Spectroscopy and Surface Analysis

• Spex 1403 Raman spectrometer (514.5 nm, 477 nm, and 532 nm laser sources)
• Perkin Elmer Lambda II UV-Vis spectrometer
• ABB-Extrel multiple-range quadrupole mass spectrometer
• Kratos ion scattering spectrometer (ISS)
• Cahn microgram electrobalance
• BET surface area system
• Quantachrome mercury porisimeter

X-ray Diffraction

• Picker MoK
• Remote-head X-ray generator
• Jarrell Ash multifocus/multianode (AgKa, CuKa) small spot generator
• Lang X-ray topography camera

Sample Preparation and Other Lab Equipment:

• Sorval MTB-2 ultramicrotomes
• Laboratory KBr pellet press
• Diamond blade trim saw
• Vacuum evaporator
• Full photographic darkroom
• Taber abraser

Current & Past Projects

The Materials Physics laboratory has supported research under a wide variety of research areas and sponsors:

• Numerous industrial projects ranging from basic failure characterization and analysis, proprietary materials development, and process design to corrosion testing and analysis
• Synthesis and characterization of interstellar diamonds (NASA)
• Testing and characterization of impact damage in radome and leading edge materials (Army & Navy)
• Analysis of aging and phase segregation in high strength aluminum alloys (USAF)
• Phase segregation analysis of commercial waxes (Bath and Body Works)
• Corrosion Preventative Compounds (CPC) for aircraft application (USAF)
• Development of hexchrome conversion coating alternatives (OH Board of Regents)
• Development of hexchrome pigment alternatives (OH Board of Regents)
• Electroless zinc deposition (USAF)
• Silicon carbide Raman stress analysis (USAF Industrial Subcontract)
• Propeller hub corrosion: Systems analysis and remedy (Hartzell Propeller)
• Diamond film synthesis for liquid hydrogen turbomachinery applications (USAF)
• Ultramicroscopy and Raman spectroscopy of 'sensitized' 316 stainless steel (EPRI)
• Thermoset sealant test-article systems analysis and remedy (USAF)
  

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