NDE Engineering Facilities (WPAFB)

The major imaging and measurement systems that we use in support of our nondestructive evaluation (NDE) research projects include the following:

• High-precision scanning acoustic microscope for localized characterization of material properties and component integrity
• SONIX ultrasonic scanning system with contour-following capabilities and submersible rotation table for component integrity characterization
• Three x-ray diffraction systems for residual stress measurement
• Laminography/dual energy x-ray computed tomography system for generating internal images of medium to large size structures and components
• Tomoscope x-ray computed tomography for high-resolution imaging of material properties and integrity
• Ultrasonic force microscope for making mechanical and elastic properties measurements at very high resolution, on the order of 1 nanometer (10-9 m)
• Atomic force microscope for topography measurements at atomic-scale resolution

Laminography/Dual Energy (LAM/DE) X-ray CT system for imaging moderate-sized components and parts.

Tomoscope X-ray CT system for high-resolution imaging of very small specimens or parts.

X-ray diffraction system for residual-stress measurements.

Mr. Reibel adjusts the position of the sensor on the high-precision scanning acoustic microscope, which belongs to AFRL/MLLP.

Dr. Ko uses the high precision scanning eddy-current system, which belongs to AFRL/MLLP.

Dr. Kramb adjusts an oscilloscope with a signal generator.