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Shamachary Sathish, Ph.D. 

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300 College Park
Dayton, OH 45469-0020


937-255-9826
937-255-1362 (fax)

 

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Structural Integrity Division

Nondestructive Evaluation Engineering


 


Group Leader
and Senior Research Engineer
Nondestructive Evaluation Engineering

 

Since 1996, Dr. Sathish has been employed by UDRI to conduct research on the use of acoustic microscopy, x-ray diffraction and non-linear acoustics for characterization of aerospace materials properties. Dr. Sathish conducts his work at the Air Force Research Laboratory’s Materials and Manufacturing Directorate.

 

Prior to joining UDRI, Dr. Sathish conducted research for more than 10 years in the development and application of scanning acoustic microscopy, Brillouin scattering, and x-ray diffraction for materials properties characterization.  He conducted that research at such diverse locations as the Norwegian Institute of Technology, Trondheim, Norway; the Swiss Federal Institute of Technology, Lausanne, Switzerland; and NASA Langley.

 

Areas of Expertise:

  • Residual stress measurements using x-ray diffraction and acoustic microscopy techniques
  • Nondestructive characterization of material properties using ultrasonics, scanning acoustic microscopy, x-ray diffraction, thermography and nonlinear acoustics
  • Nondestructive characterization of composites, fiber-matrix interfaces, and individual fibers using very-high-resolution scanning acoustic microscopy techniques
  • Acoustic lens design and fabrication for localized residual stress and properties measurements

Education:

  • Ph. D., Physics, University of  Mysore, India, 1986
  • M. S., Physics, University of Mysore, India, 1976
  • B. S., Physics, Mathematics and Chemistry University of Mysore, India, 1974

Recent Publications:

  • Sathish, S., and R. W. Martin, “Quantitative Mapping of Rayleigh Wave Velocity with Scanning Acoustic Microscope,” IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, May 2000.

  • Sathish, S., Martin, R. W., and T. H. Moran, “Stress Mapping with Surface Skimming Longitudinal Wave Velocity Measurements in a Scanning Acoustic Microscope,” Journal of the Acoustic Society of America (accepted for publication).

  • Blackshire, J., and S. Sathish, “Near-Field Scattering of Rayleigh Surface Acoustic Waves by Surface-Breaking Cracks,” Applied Physics Letters, May 2002.

  • Druffner, C., Schumaker, E., Shen, L., Meyendorf, N., Sathish, S., Raikar, G., and A. Brar, “High Resolution Nondestructive Material Characterization by Atomic Force Microscopy and Ultrasonic Force Microscopy,” Proceedings of the Eighth Annual International Conference on Composite Engineering (ICCE/8), 2001.

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